diff options
| author |   Paul Cercueil <paul@crapouillou.net> | 2022-01-10 18:22:55 +0000 |
|---|---|---|
| committer |   Guenter Roeck <linux@roeck-us.net> | 2022-02-27 17:03:16 -0800 |
| commit | 32b9a19a1966fb3124d7ddd60ebd08688be2f3fa (patch) | |
| tree | 070c7d7b7e8ed4243e6ceb661179509e85b4638b | |
| parent | hwmon: (nct6775) add support for TSI temperature registers (diff) | |
| download | linux-dev-32b9a19a1966fb3124d7ddd60ebd08688be2f3fa.tar.xz linux-dev-32b9a19a1966fb3124d7ddd60ebd08688be2f3fa.zip | |
ABI: hwmon: Document "label" sysfs attribute
Add the "label" sysfs attribute, which can contain a descriptive label
that allows to uniquely identify a device within the system.
Signed-off-by: Paul Cercueil <paul@crapouillou.net>
Link: https://lore.kernel.org/r/20220110182256.30763-2-paul@crapouillou.net
Signed-off-by: Guenter Roeck <linux@roeck-us.net>
Diffstat (limited to '')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-class-hwmon | 8 | ||||
| -rw-r--r-- | Documentation/hwmon/sysfs-interface.rst | 4 |
2 files changed, 12 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-hwmon b/Documentation/ABI/testing/sysfs-class-hwmon index 1f20687def44..653d4c75eddb 100644 --- a/Documentation/ABI/testing/sysfs-class-hwmon +++ b/Documentation/ABI/testing/sysfs-class-hwmon @@ -9,6 +9,14 @@ Description: RO +What: /sys/class/hwmon/hwmonX/label +Description: + A descriptive label that allows to uniquely identify a + device within the system. + The contents of the label are free-form. + + RO + What: /sys/class/hwmon/hwmonX/update_interval Description: The interval at which the chip will update readings. diff --git a/Documentation/hwmon/sysfs-interface.rst b/Documentation/hwmon/sysfs-interface.rst index 85652a6aaa3e..209626fb2405 100644 --- a/Documentation/hwmon/sysfs-interface.rst +++ b/Documentation/hwmon/sysfs-interface.rst @@ -99,6 +99,10 @@ Global attributes `name` The chip name. +`label` + A descriptive label that allows to uniquely identify a device + within the system. + `update_interval` The interval at which the chip will update readings. |