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| author |   Chen-Yu Tsai <wens@csie.org> | 2019-01-18 03:52:03 -0500 |
|---|---|---|
| committer |   Mauro Carvalho Chehab <mchehab+samsung@kernel.org> | 2019-02-18 11:28:49 -0500 |
| commit | 2aff1fc3653ade61d27e4355346934d71ae0fe59 (patch) | |
| tree | 2c4b4c799f6bd1213e5454931c1ff8b7867ac272 /drivers/media/i2c/ov5640.c | |
| parent | media: ov5640: Add register definition for test pattern register (diff) | |
| download | linux-dev-2aff1fc3653ade61d27e4355346934d71ae0fe59.tar.xz linux-dev-2aff1fc3653ade61d27e4355346934d71ae0fe59.zip | |
media: ov5640: Disable transparent feature for test pattern
The transparent feature for test patterns blends the test pattern with
an actual captured image. This makes the result non-static, subject to
changes in the sensor's field of view.
Test patterns should be predictable and deterministic, even if they are
dynamic patterns. Disable the transparent feature of the test pattern.
Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
Diffstat (limited to '')
| -rw-r--r-- | drivers/media/i2c/ov5640.c | 3 |
1 files changed, 1 insertions, 2 deletions
diff --git a/drivers/media/i2c/ov5640.c b/drivers/media/i2c/ov5640.c index 22d07b3cc8a2..a1fd69a21df1 100644 --- a/drivers/media/i2c/ov5640.c +++ b/drivers/media/i2c/ov5640.c @@ -2461,8 +2461,7 @@ static const char * const test_pattern_menu[] = { static const u8 test_pattern_val[] = { 0, - OV5640_TEST_ENABLE | OV5640_TEST_TRANSPARENT | - OV5640_TEST_BAR_VERT_CHANGE_1 | + OV5640_TEST_ENABLE | OV5640_TEST_BAR_VERT_CHANGE_1 | OV5640_TEST_BAR, }; |