thermal: exynos: remove needless test_mux_addr_shift abstraction

reg->test_mux_addr_shift is used only if pdata->test_mux is
non-zero.  pdata->test_mux is defined only on Exynos3250 and
Exynos4412 (other SoC types don't even have pdata->test_mux
entry assigned in their struct exynos_tmu_registers instances)
so the abstraction is not needed and can be removed.

There should be no functional changes caused by this patch.

Cc: Amit Daniel Kachhap <amit.daniel@samsung.com>
Cc: Lukasz Majewski <l.majewski@samsung.com>
Cc: Eduardo Valentin <edubezval@gmail.com>
Cc: Zhang Rui <rui.zhang@intel.com>
Signed-off-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@samsung.com>
Acked-by: Kyungmin Park <kyungmin.park@samsung.com>
Tested-by: Lukasz Majewski <l.majewski@samsung.com>
Signed-off-by: Eduardo Valentin <edubezval@gmail.com>

1 files changed, 0 insertions, 2 deletions

diff --git a/drivers/thermal/samsung/exynos_tmu.h b/drivers/thermal/samsung/exynos_tmu.h
index cee81a1de8e3..0fb10d158471 100644
--- a/drivers/thermal/samsung/exynos_tmu.h
+++ b/drivers/thermal/samsung/exynos_tmu.h
@@ -77,7 +77,6 @@ enum soc_type {
  * bitfields. The register validity, offsets and bitfield values may vary
  * slightly across different exynos SOC's.
  * @tmu_ctrl: TMU main controller register.
- * @test_mux_addr_shift: shift bits of test mux address.
  * @therm_trip_mode_shift: shift bits of tripping mode in tmu_ctrl register.
  * @therm_trip_mode_mask: mask bits of tripping mode in tmu_ctrl register.
  * @therm_trip_en_shift: shift bits of tripping enable in tmu_ctrl register.
@@ -103,7 +102,6 @@ enum soc_type {
  */
 struct exynos_tmu_registers {
 	u32	tmu_ctrl;
-	u32     test_mux_addr_shift;
 	u32	therm_trip_mode_shift;
 	u32	therm_trip_mode_mask;
 	u32	therm_trip_en_shift;