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| author |   Dan Williams <dan.j.williams@intel.com> | 2018-10-17 10:47:19 -0700 |
|---|---|---|
| committer | Dan Williams <dan.j.williams@intel.com> | 2018-10-17 10:47:19 -0700 |
| commit | f110176633d74bbac1f80ab9b9c6b83ea3e1cc23 (patch) | |
| tree | f373f4a5ba3a6aaadbd54735b39fe4668fc27549 /tools/testing/nvdimm/test/nfit.c | |
| parent | acpi, nfit: Collect shutdown status (diff) | |
| download | linux-dev-f110176633d74bbac1f80ab9b9c6b83ea3e1cc23.tar.xz linux-dev-f110176633d74bbac1f80ab9b9c6b83ea3e1cc23.zip | |
tools/testing/nvdimm: Populate dirty shutdown data
Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.
Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to '')
| -rw-r--r-- | tools/testing/nvdimm/test/nfit.c | 3 |
1 files changed, 2 insertions, 1 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c index f1a2a1a7bb1b..9527d47a1070 100644 --- a/tools/testing/nvdimm/test/nfit.c +++ b/tools/testing/nvdimm/test/nfit.c @@ -149,6 +149,7 @@ static const struct nd_intel_smart smart_def = { | ND_INTEL_SMART_ALARM_VALID | ND_INTEL_SMART_USED_VALID | ND_INTEL_SMART_SHUTDOWN_VALID + | ND_INTEL_SMART_SHUTDOWN_COUNT_VALID | ND_INTEL_SMART_MTEMP_VALID | ND_INTEL_SMART_CTEMP_VALID, .health = ND_INTEL_SMART_NON_CRITICAL_HEALTH, @@ -161,8 +162,8 @@ static const struct nd_intel_smart smart_def = { .ait_status = 1, .life_used = 5, .shutdown_state = 0, + .shutdown_count = 42, .vendor_size = 0, - .shutdown_count = 100, }; struct nfit_test_fw { |