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authorJiong Wang <jiong.wang@netronome.com>2019-05-24 23:25:20 +0100
committerAlexei Starovoitov <ast@kernel.org>2019-05-24 18:58:37 -0700
commitf3b55abb6d5a522228e136c3bc4a9a716d5d8a54 (patch)
tree67608709b1dd5b9e560e5af8238e978d0b6feaa0 /tools/testing/selftests/bpf/test_socket_cookie.c
parentlibbpf: add "prog_flags" to bpf_program/bpf_prog_load_attr/bpf_load_program_attr (diff)
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selftests: bpf: adjust several test_verifier helpers for insn insertion
- bpf_fill_ld_abs_vlan_push_pop: Prevent zext happens inside PUSH_CNT loop. This could happen because of BPF_LD_ABS (32-bit def) + BPF_JMP (64-bit use), or BPF_LD_ABS + EXIT (64-bit use of R0). So, change BPF_JMP to BPF_JMP32 and redefine R0 at exit path to cut off the data-flow from inside the loop. - bpf_fill_jump_around_ld_abs: Jump range is limited to 16 bit. every ld_abs is replaced by 6 insns, but on arches like arm, ppc etc, there will be one BPF_ZEXT inserted to extend the error value of the inlined ld_abs sequence which then contains 7 insns. so, set the dividend to 7 so the testcase could work on all arches. - bpf_fill_scale1/bpf_fill_scale2: Both contains ~1M BPF_ALU32_IMM which will trigger ~1M insn patcher call because of hi32 randomization later when BPF_F_TEST_RND_HI32 is set for bpf selftests. Insn patcher is not efficient that 1M call to it will hang computer. So , change to BPF_ALU64_IMM to avoid hi32 randomization. Signed-off-by: Jiong Wang <jiong.wang@netronome.com> Signed-off-by: Alexei Starovoitov <ast@kernel.org>
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