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path: root/Documentation/usb/gadget-testing.txt (follow)
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2015-05-07usb: gadget: rndis: remove the limit of available rndis connectionsAndrzej Pietrasiewicz1-2/+0
RNDIS function has a limitation on the number of allowed instances. So far it has been RNDIS_MAX_CONFIGS, which happens to be one. In order to eliminate this kind of arbitrary limitation we should not preallocate a predefined (RNDIS_MAX_CONFIGS) array of struct rndis_params instances but instead allow allocating them on demand. This patch allocates struct rndis_params on demand in rndis_register(). Coversly, the structure is free()'d in rndis_deregister(). If CONFIG_USB_GADGET_DEBUG_FILES is set, the proc files are created which is the same behaviour as before, but the moment of creation is delayed until struct rndis_params is actually allocated. rnids_init() and rndis_exit() have nothing to do, so they are eliminated. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-04-27usb: Documentation: gadget-testing: fix parameter for capture channel maskPeter Chen1-1/+1
Fix the UAC2 parameter capture channel mask Signed-off-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-03-10usb: gadget: printer: add configfs supportAndrzej Pietrasiewicz1-0/+47
Add support for configfs interface so that f_printer can be used as a component of usb gadgets composed with it. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: UVC function testingAndrzej Pietrasiewicz1-0/+73
Summary of how to test UVC function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: UAC2 function testingAndrzej Pietrasiewicz1-0/+39
Summary of how to test UAC2 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: UAC1 function testingAndrzej Pietrasiewicz1-0/+27
Summary of how to test UAC1 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: SOURCESINK function testingAndrzej Pietrasiewicz1-0/+27
Summary of how to test SOURCESINK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: SERIAL function testingAndrzej Pietrasiewicz1-0/+31
Summary of how to test SERIAL function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: RNDIS function testingAndrzej Pietrasiewicz1-0/+36
Summary of how to test RNDIS function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: PHONET function testingAndrzej Pietrasiewicz1-0/+64
Summary of how to test PHONET function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: OBEX function testingAndrzej Pietrasiewicz1-0/+29
Summary of how to test OBEX function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: NCM function testingAndrzej Pietrasiewicz1-0/+34
Summary of how to test NCM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: MIDI function testingAndrzej Pietrasiewicz1-0/+84
Summary of how to test MIDI function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: MASS STORAGE function testingAndrzej Pietrasiewicz1-0/+54
Summary of how to test MASS STORAGE function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: LOOPBACK function testingAndrzej Pietrasiewicz1-0/+23
Summary of how to test LOOPBACK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: HID function testingAndrzej Pietrasiewicz1-0/+47
Summary of how to test HID function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: FFS function testingAndrzej Pietrasiewicz1-0/+24
Summary of how to test FFS (FunctionFS) function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: EEM function testingAndrzej Pietrasiewicz1-0/+34
Summary of how to test EEM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: ECM subset function testingAndrzej Pietrasiewicz1-0/+34
Summary of how to test ECM subset function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: ECM function testingAndrzej Pietrasiewicz1-0/+34
Summary of how to test ECM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12Documentation: usb: ACM function testingAndrzej Pietrasiewicz1-0/+34
The newly added file will be used to provide descriptions of how to test the functions of USB gadgets. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
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