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2010-01-13mtd: tests: fix read, speed and stress tests on NOR flashMorten Thunberg Svendsen3-3/+16
Before using block_isbad() check if mtd->block_isbad() is defined. Calculating pgcnt must be done using pgsize defined to 512 on NOR and mtd->writesize for NAND, not using mtd->writesize directly. Signed-off-by: Morten Thunberg Svendsen <mts.doredevelopment@gmail.com> Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30mtd: make pagetest workArtem Bityutskiy1-0/+1
The mtd_pagetest test did not initialize the pgsize variable, which basically means it did not work. This problem was reported by Török Edwin <edwintorok@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30mtd: add nand_ecc test moduleAkinobu Mita2-0/+88
This module tests NAND ECC functions. The test is simple. 1. Create a 256 or 512 bytes block of data filled with random bytes (data) 2. Duplicate the data block and inject single bit error (error_data) 3. Try to correct error_data 4. Compare data and error_data Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Acked-by: Vimal Singh <vimalsingh@ti.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-10-17mtd: cleanup mtd_oobtestAkinobu Mita1-14/+4
- Remove unnecessary memset for bbt All entries will be initialized at a few lines below - Remove unnecessary initialization for mtd->erasesize - Use write_whole_device() Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-09-04mtd: tests: fix read buffer overflowsRoel Kluin2-7/+7
Check whether index is within bounds before testing the element. Signed-off-by: Roel Kluin <roel.kluin@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-03-30trivial: NULL noise: drivers/mtd/tests/mtd_*test.cHannes Eder2-13/+13
Fix this sparse warnings: drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer Signed-off-by: Hannes Eder <hannes@hanneseder.net> Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: Jiri Kosina <jkosina@suse.cz>
2009-01-05[MTD] [TESTS] Fix some size_t printk format warningsDavid Woodhouse2-4/+4
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2008-12-10MTD: add MTD tests to compilationArtem Bityutskiy1-0/+7
Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10MTD: tests: add mtd_torturetestArtem Bityutskiy1-0/+530
This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_subpagetestArtem Bityutskiy1-0/+525
This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_stresstestArtem Bityutskiy1-0/+330
This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_speedtestArtem Bityutskiy1-0/+502
This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_readtestArtem Bityutskiy1-0/+253
A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_pagetestArtem Bityutskiy1-0/+632
This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_oobtestArtem Bityutskiy1-0/+742
This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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