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2009-09-04mtd: tests: fix read buffer overflowsRoel Kluin2-7/+7
Check whether index is within bounds before testing the element. Signed-off-by: Roel Kluin <roel.kluin@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-03-30trivial: NULL noise: drivers/mtd/tests/mtd_*test.cHannes Eder2-13/+13
Fix this sparse warnings: drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer Signed-off-by: Hannes Eder <hannes@hanneseder.net> Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: Jiri Kosina <jkosina@suse.cz>
2009-01-05[MTD] [TESTS] Fix some size_t printk format warningsDavid Woodhouse2-4/+4
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2008-12-10MTD: add MTD tests to compilationArtem Bityutskiy1-0/+7
Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10MTD: tests: add mtd_torturetestArtem Bityutskiy1-0/+530
This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_subpagetestArtem Bityutskiy1-0/+525
This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_stresstestArtem Bityutskiy1-0/+330
This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_speedtestArtem Bityutskiy1-0/+502
This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_readtestArtem Bityutskiy1-0/+253
A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_pagetestArtem Bityutskiy1-0/+632
This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08MTD: tests: add mtd_oobtestArtem Bityutskiy1-0/+742
This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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