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Support for NAND biterrors test on platforms without raw write
While the default test mode relies on raw write (mtd_write_oob) to introduce
bit errors into a page, the rewrite test mode doesn't need it.
Changed the overwrite test to use normal writes. The default test mode
is unaffected and still requires raw write as before.
Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com>
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
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Implement ecc->write_subpage() to prevent core code from assigning this
hook to nand_write_subpage_hwecc(). This default implementation tries
to call ecc->hwctl() which in our case is NULL, thus leading to a NULL
pointer dereference.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
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Verify that the ecc->size value is either 512 or 1024 bytes.
This should always be the case if this field was assigned to the
nand->ecc_step_size_ds value, but can be wrong when the user overloaded
this value with the nand-ecc-step-size DT property.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
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Switching to 1k ECC blocks when possible provides better resistance against
concentrated bitflips. Say you have those two configurations:
1/ 16bits/512bytes
2/ 32bits/1024bytes
Both of them require the same amount of ECC bytes (only true for this
specific engine), but the second config allows you to correct the case
where most of your bitflips are concentrated in a single 512bytes portion.
This fact makes the 1k ECC block size more advantageous than the 512bytes
one.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
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The column address passed to the RNDOUT operation was missing the page
size offset.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
Fixes: 614049a8d904 ("mtd: nand: sunxi: add support for DMA assisted operations")
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Add support for mediatek's SDG1 NFC nand controller embedded in SoC
2701
Signed-off-by: Jorge Ramirez-Ortiz <jorge.ramirez-ortiz@linaro.org>
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
Tested-by: Xiaolei Li <xiaolei.li@mediatek.com>
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