diff options
| author |   Jonathan Cameron <Jonathan.Cameron@huawei.com> | 2022-06-26 13:29:23 +0100 |
|---|---|---|
| committer | Jonathan Cameron <Jonathan.Cameron@huawei.com> | 2022-08-15 22:30:00 +0100 |
| commit | 1efc41035f1841acf0af2bab153158e27ce94f10 (patch) | |
| tree | 26037028ce26304aaeb2838019385194e7884da6 | |
| parent | iio: inkern: fix coding style warnings (diff) | |
iio: ABI: Fix wrong format of differential capacitance channel ABI.
in_ only occurs once in these attributes.
Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 2 |
1 files changed, 1 insertions, 1 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 7faec5b3a553..979f2e2b44f6 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -196,7 +196,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads. -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@vger.kernel.org Description: |