diff options
| author |   Luo Andy <yifei.luo@intel.com> | 2010-11-23 10:41:21 +0800 |
|---|---|---|
| committer |   Greg Kroah-Hartman <gregkh@suse.de> | 2010-11-30 16:50:36 -0800 |
| commit | 7fc56f0d9908fe140a01387d59954e3d0a2e7744 (patch) | |
| tree | 88cbdeeacff090643c8b2dc6e44df82b2d1f2b6b /include/linux/usb | |
| parent | usb: composite gadget: set vbus_draw current limitation during suspend (diff) | |
| download | linux-dev-7fc56f0d9908fe140a01387d59954e3d0a2e7744.tar.xz linux-dev-7fc56f0d9908fe140a01387d59954e3d0a2e7744.zip | |
usb: gadget: langwell_udc: add usb test mode support
This patch adds test mode support for Langwell gadget driver.
Signed-off-by: Henry Yuan <hang.yuan@intel.com>
Signed-off-by: Andy Luo <yifei.luo@intel.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
Diffstat (limited to 'include/linux/usb')
| -rw-r--r-- | include/linux/usb/ch9.h | 10 |
1 files changed, 10 insertions, 0 deletions
diff --git a/include/linux/usb/ch9.h b/include/linux/usb/ch9.h index f917bbbc8901..ab461948b579 100644 --- a/include/linux/usb/ch9.h +++ b/include/linux/usb/ch9.h @@ -124,6 +124,16 @@ #define USB_DEVICE_DEBUG_MODE 6 /* (special devices only) */ /* + * Test Mode Selectors + * See USB 2.0 spec Table 9-7 + */ +#define TEST_J 1 +#define TEST_K 2 +#define TEST_SE0_NAK 3 +#define TEST_PACKET 4 +#define TEST_FORCE_EN 5 + +/* * New Feature Selectors as added by USB 3.0 * See USB 3.0 spec Table 9-6 */ |