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author | 2022-06-14 10:46:12 +0200 | |
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committer | 2022-06-16 20:29:06 -0700 | |
commit | 5c2d0a6a0701ba86a4bb0bf1876266c751e328bd (patch) | |
tree | a3191c55afbe8ec7ad8714ce8179dd44992c762e /tools/testing/selftests/bpf/prog_tests | |
parent | linux/phy.h: add phydev_err_probe() wrapper for dev_err_probe() (diff) | |
download | linux-dev-5c2d0a6a0701ba86a4bb0bf1876266c751e328bd.tar.xz linux-dev-5c2d0a6a0701ba86a4bb0bf1876266c751e328bd.zip |
net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell
We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the (factory calibrated) reset
value or using one of the two boolean properties to set it to the
min/max value - are too coarse.
Implement support for the newly added binding allowing device tree to
specify an nvmem cell containing an appropriate value for this
specific board.
Signed-off-by: Rasmus Villemoes <linux@rasmusvillemoes.dk>
Signed-off-by: Jakub Kicinski <kuba@kernel.org>
Diffstat (limited to 'tools/testing/selftests/bpf/prog_tests')
0 files changed, 0 insertions, 0 deletions