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| author |   bamvor.zhangjian@huawei.com <bamvor.zhangjian@huawei.com> | 2016-11-29 19:55:51 +0800 |
|---|---|---|
| committer |   Shuah Khan <shuahkh@osg.samsung.com> | 2017-01-05 13:42:17 -0700 |
| commit | 80d443e8876602be2c130f79c4de81e12e2a700d (patch) | |
| tree | dbe443dd36f2b043654ccff605dca385f4b8e70a /tools/testing/selftests/pstore/Makefile | |
| parent | selftests: remove CROSS_COMPILE in dedicated Makefile (diff) | |
| download | linux-dev-80d443e8876602be2c130f79c4de81e12e2a700d.tar.xz linux-dev-80d443e8876602be2c130f79c4de81e12e2a700d.zip | |
selftests: add EXTRA_CLEAN for clean target
Some testcases need the clean extra data after running. This patch
introduce the "EXTRA_CLEAN" variable to address this requirement.
After KBUILD_OUTPUT is enabled in later patch, it will be easy to
decide to if we need do the cleanup in the KBUILD_OUTPUT path(if the
testcase ran immediately after compiled).
Signed-off-by: Bamvor Jian Zhang <bamvor.zhangjian@linaro.org>
Signed-off-by: Shuah Khan <shuahkh@osg.samsung.com>
Diffstat (limited to 'tools/testing/selftests/pstore/Makefile')
| -rw-r--r-- | tools/testing/selftests/pstore/Makefile | 4 |
1 files changed, 1 insertions, 3 deletions
diff --git a/tools/testing/selftests/pstore/Makefile b/tools/testing/selftests/pstore/Makefile index bd7abe24ea08..c5f2440ba1f7 100644 --- a/tools/testing/selftests/pstore/Makefile +++ b/tools/testing/selftests/pstore/Makefile @@ -5,11 +5,9 @@ all: TEST_PROGS := pstore_tests pstore_post_reboot_tests TEST_FILES := common_tests pstore_crash_test +EXTRA_CLEAN := logs/* *uuid include ../lib.mk run_crash: @sh pstore_crash_test || { echo "pstore_crash_test: [FAIL]"; exit 1; } - -clean: - rm -rf logs/* *uuid |