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-rw-r--r--Documentation/ABI/testing/sysfs-bus-iio71
1 files changed, 69 insertions, 2 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index 39c8de0e53d0..b20e829d350f 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -79,7 +79,7 @@ Description:
correspond to externally available input one of the named
versions may be used. The number must always be specified and
unique to allow association with event codes. Units after
- application of scale and offset are microvolts.
+ application of scale and offset are millivolts.
What: /sys/bus/iio/devices/iio:deviceX/in_voltageY-voltageZ_raw
KernelVersion: 2.6.35
@@ -90,7 +90,7 @@ Description:
physically equivalent inputs when non differential readings are
separately available. In differential only parts, then all that
is required is a consistent labeling. Units after application
- of scale and offset are microvolts.
+ of scale and offset are millivolts.
What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw
KernelVersion: 3.2
@@ -537,6 +537,62 @@ Description:
value is in raw device units or in processed units (as _raw
and _input do on sysfs direct channel read attributes).
+What: /sys/.../events/in_accel_x_thresh_rising_hysteresis
+What: /sys/.../events/in_accel_x_thresh_falling_hysteresis
+What: /sys/.../events/in_accel_x_thresh_either_hysteresis
+What: /sys/.../events/in_accel_y_thresh_rising_hysteresis
+What: /sys/.../events/in_accel_y_thresh_falling_hysteresis
+What: /sys/.../events/in_accel_y_thresh_either_hysteresis
+What: /sys/.../events/in_accel_z_thresh_rising_hysteresis
+What: /sys/.../events/in_accel_z_thresh_falling_hysteresis
+What: /sys/.../events/in_accel_z_thresh_either_hysteresis
+What: /sys/.../events/in_anglvel_x_thresh_rising_hysteresis
+What: /sys/.../events/in_anglvel_x_thresh_falling_hysteresis
+What: /sys/.../events/in_anglvel_x_thresh_either_hysteresis
+What: /sys/.../events/in_anglvel_y_thresh_rising_hysteresis
+What: /sys/.../events/in_anglvel_y_thresh_falling_hysteresis
+What: /sys/.../events/in_anglvel_y_thresh_either_hysteresis
+What: /sys/.../events/in_anglvel_z_thresh_rising_hysteresis
+What: /sys/.../events/in_anglvel_z_thresh_falling_hysteresis
+What: /sys/.../events/in_anglvel_z_thresh_either_hysteresis
+What: /sys/.../events/in_magn_x_thresh_rising_hysteresis
+What: /sys/.../events/in_magn_x_thresh_falling_hysteresis
+What: /sys/.../events/in_magn_x_thresh_either_hysteresis
+What: /sys/.../events/in_magn_y_thresh_rising_hysteresis
+What: /sys/.../events/in_magn_y_thresh_falling_hysteresis
+What: /sys/.../events/in_magn_y_thresh_either_hysteresis
+What: /sys/.../events/in_magn_z_thresh_rising_hysteresis
+What: /sys/.../events/in_magn_z_thresh_falling_hysteresis
+What: /sys/.../events/in_magn_z_thresh_either_hysteresis
+What: /sys/.../events/in_voltageY_thresh_rising_hysteresis
+What: /sys/.../events/in_voltageY_thresh_falling_hysteresis
+What: /sys/.../events/in_voltageY_thresh_either_hysteresis
+What: /sys/.../events/in_tempY_thresh_rising_hysteresis
+What: /sys/.../events/in_tempY_thresh_falling_hysteresis
+What: /sys/.../events/in_tempY_thresh_either_hysteresis
+What: /sys/.../events/in_illuminance0_thresh_falling_hysteresis
+what: /sys/.../events/in_illuminance0_thresh_rising_hysteresis
+what: /sys/.../events/in_illuminance0_thresh_either_hysteresis
+what: /sys/.../events/in_proximity0_thresh_falling_hysteresis
+what: /sys/.../events/in_proximity0_thresh_rising_hysteresis
+what: /sys/.../events/in_proximity0_thresh_either_hysteresis
+KernelVersion: 3.13
+Contact: linux-iio@vger.kernel.org
+Description:
+ Specifies the hysteresis of threshold that the device is comparing
+ against for the events enabled by
+ <type>Y[_name]_thresh[_(rising|falling)]_hysteresis.
+ If separate attributes exist for the two directions, but
+ direction is not specified for this attribute, then a single
+ hysteresis value applies to both directions.
+ For falling events the hysteresis is added to the _value attribute for
+ this event to get the upper threshold for when the event goes back to
+ normal, for rising events the hysteresis is subtracted from the _value
+ attribute. E.g. if in_voltage0_raw_thresh_rising_value is set to 1200
+ and in_voltage0_raw_thresh_rising_hysteresis is set to 50. The event
+ will get activated once in_voltage0_raw goes above 1200 and will become
+ deactived again once the value falls below 1150.
+
What: /sys/.../events/in_accel_x_raw_roc_rising_value
What: /sys/.../events/in_accel_x_raw_roc_falling_value
What: /sys/.../events/in_accel_y_raw_roc_rising_value
@@ -811,3 +867,14 @@ Description:
Writing '1' stores the current device configuration into
on-chip EEPROM. After power-up or chip reset the device will
automatically load the saved configuration.
+
+What: /sys/.../iio:deviceX/in_intensity_red_integration_time
+What: /sys/.../iio:deviceX/in_intensity_green_integration_time
+What: /sys/.../iio:deviceX/in_intensity_blue_integration_time
+What: /sys/.../iio:deviceX/in_intensity_clear_integration_time
+What: /sys/.../iio:deviceX/in_illuminance_integration_time
+KernelVersion: 3.12
+Contact: linux-iio@vger.kernel.org
+Description:
+ This attribute is used to get/set the integration time in
+ seconds.