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| author |   Jakub Kicinski <kuba@kernel.org> | 2022-06-16 20:29:07 -0700 |
|---|---|---|
| committer | Jakub Kicinski <kuba@kernel.org> | 2022-06-16 20:29:08 -0700 |
| commit | 6c0d09d9374c025f503d33bcef5f656e3f1dd349 (patch) | |
| tree | a3191c55afbe8ec7ad8714ce8179dd44992c762e /tools/testing/selftests/bpf/prog_tests | |
| parent | Merge git://git.kernel.org/pub/scm/linux/kernel/git/netdev/net (diff) | |
| parent | net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell (diff) | |
| download | linux-dev-6c0d09d9374c025f503d33bcef5f656e3f1dd349.tar.xz linux-dev-6c0d09d9374c025f503d33bcef5f656e3f1dd349.zip | |
Merge branch 'dt-bindings-dp83867-add-binding-for-io_impedance_ctrl-nvmem-cell'
Rasmus Villemoes says:
====================
dt-bindings: dp83867: add binding for io_impedance_ctrl nvmem cell
We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the reset value (which is
factory calibrated to a value corresponding to approximately 50 ohms)
or using one of the two boolean properties to set it to the min/max
value - are too coarse.
This series adds a device tree binding for an nvmem cell which can be
populated during production with a suitable value calibrated for each
board, and corresponding support in the driver. The second patch adds
a trivial phy wrapper for dev_err_probe(), used in the third.
====================
Link: https://lore.kernel.org/r/20220614084612.325229-1-linux@rasmusvillemoes.dk
Signed-off-by: Jakub Kicinski <kuba@kernel.org>
Diffstat (limited to 'tools/testing/selftests/bpf/prog_tests')
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